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اسم الجهاز

الخصائص

المنشأ

1

SEM+GOLD SPUTTERING

is used to measure nano size structure and to characterize the surface topography of Nanomaterial's with high resolving power up to 1nm

Magnification:1x to 100,000x

USA

2

XRD

is used to determine the crystal structure of solid materials by the interaction of x-ray with the atoms of crystalline solids which is normally distributed in regular arrangements

Scanning radius: 185mm

Shimadzu / Japan

3

AFM

is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer,

Resolution: AFM 0.26nm lateral, 0.1nm vertical

USA

4

ZETA POTENTIAL

Is used to measure the electrokinetic potentional in colliodal dispersions

Standard Laser: 35 mW red diode laser, nominal 640 nm wavelength

USA

5

PARTICLE SIZE ANALYZER

Is used to determine the particle size of nanomaterials suspended in liquids.

Standard Laser: 35 mW red diode laser, nominal 640 nm wavelength

USA

6

GC

The GC-2010 Plus enables reliable, high-precision trace analysis with high repeatability, utilizing detectors such as FID and FPD that feature best-in-class sensitivity

Shimadzu / Japan

7

Atomic Force Spectrophotometer

Photometry section

·Measured wavelength : 185 to 900 nm

·Spectroscope : aberration correction type, Czerny-Turner mount

·Bandwidth : 0.2, 0.7, 0.7 L, 2.0 Lnm (automatic converted in 4 steps)

·Detector : photo multiplier (185.0 to 600.0 nm), semiconductor (600.1 to 900.0 nm)

· Background correction : high-speed self-reversal, high-speed deuterium lamp

·Number of mounted lamps : 6 and 2 arbitrary lighted on the same time (another 1 for extra light)

·Lighting mode : EMISSION, NON-BGC, BGC-SR, BGC-D2

Date processing

·OS : AA Wizard (for device control character and date processing)

Burner part

·Burner head : 10 cm (about 3.9") slot made of titanium

·Nebulizer : Pt-Ir capillary, teflon orifice

·Power supply : AC 100, 120, 230 V  50/60 Hz

External dimension : W 835 x D 545 x H 460 mm (about W 2.74 ft x D 1.79 ft x 1.51 ft)

Weight : approx. 70 kg (about 154.5 lb)

Shimadzu / Japan

8

UV-Vis spectrum

UV/Visible Spectrophotometer is an accurate, reliable, and cost effective instrument designed for quality control, research, and teaching requirements.

Wavelength Range: 190~1100nm

Taiwan

9

FTIR spectrum

Fourier Transform Infrared (FTIR) Spectrophotometer: An analysis system that irradiates samples with infrared light, detects the transmitted or reflected light from the sample and uses “Fourier transform” mathematical processing to obtain spectra

Measuring Wavenumber Range: 7800 cm^-1 to 350 cm^-1

Shimadzu / Japan

10

Optical Microscopes

The microscope is used in research fields, such as biology, bacteriology, histology and pharmaceutical chemistry etc.

Magnification: 4x to 1200x sample size: 140X160mm

Germany

11

جهاز قياس معدل التاكل

·         Portable, Low Noise

·         Potential Range: ±2.000 V

·         CV Scan Rate: 1e-5 to 1e-10 V/sec

USA

12

جهاز فحص الامواج فوق الصوتية

Used for structural assessment and prediction of the mechanical properties and modulus of elasticity for construction materials.

Switzerland

13

جهاز قياس الصلادة المايكروية

·        Testing Force: 10g (0.098N)- 1000g (9.8N)

·        Min. Measuring Unit: 0.01μm

·        Hardness Value Rang: 1HV-4000HV/1HK-4000HK

·        Specimen Allowing Maximum Height: 85mm

·        Throat Depth: 120mm

·        Instrument size: 490×185×515mm(L×W×H)

·        Instrument weight: 45k

China

14

جهاز فحص الانضغاطية

JYS-2000A digital display building materials compression testing machine is mainly used to brick, cement and concrete compression test:

Max. capacity (KN): 2000

Measuring range: 4%-100% of FS

China

15

جهاز فحص الصدمة

It is used to test or determine the anti- impact capacity of non-metal materials such as plastic

Impact velocity:  3.8 m/s

Pendulum energy: 0.5J  1J  2J  4J  5J

China

16

جهاز فحص الصلادة

Digital Micro Vickers Hardness Testers

Test Forces: (0.098, 0.246, 0.49, 0.98, 1.96, 2.94, 4.90, 9.80) N

China

17

جهاز فحص الشد

PL

China

18

OSCILLOSCOPE

Max real time sampling rate: 400Msps

Max equivalent sampling rate: 10Gsps

Bandwidth: 25MHz

Input impedance: 1MΩ||18pF

Germany

19

HALL EFFECT SETUP

Range: 0-200mV (Resolutio 100μV)

Accuracy: ±0.1% of reading ±1 digit

Impedance: 1Mohm

India

20

KETHELY SOURCE METER

Built-in sweeps for I/V, I/R, V/I, and V/R characterization

Ohms Range <0.2 Ω to >200 Ω

Current Range ±10 pA to ±1.05 A

Voltage Range ±1 µV to ±210 V

Kethely/ USA

21

MULTIAMATE

V DC Ranges: 100 mV to 1000 V

V AC Ranges: 8845A: 100 mV to 750 V

Resistance Ranges: 8845A: 100 Ω to 100 MΩ

A DC Ranges: 100 μA to 10 A

A AC Ranges: 10 mA to 10 A

Capacitance Ranges 1 nF to 0.1 F

Temperature Ranges: -200 °C to +600 °

USA